Memory Automated Testing System
Built-in 4 sets of ICT-384 tester，provides maximally 32 x 4 128 duts parallel testing.
Proprietary for high density NOR/NAND Flash or serial Flash memory that requires long elapsed testing time.
Fully automatic control on load/pick-and-place/test/bin/unload in sequence.
■ Pick and Place
Two high resolution CCD cameras in place for precise alignment. Fixed (on table) upward CCD for IC device alignment and Carried (by arm) downward CCD for socket alignment.
■ Multiple ICs Parallel Test
4 sets of ICT-384 tester provide maximally 128 duts parallel test
■ High Throughput
picks up 4 chips at a time and place one-by-one in sequence, performs about 1,200 uph capacity(if testing time < 6 minutes)
■ Intuitive User Interface
User friendly Intuitive graphic user interface software.
The settings of parameters and test result are autosaved for next job, qualilty control and yield-rate tracking.