ICT-192 - hilosystems

ICT-192

Memory IC Tester

ICT 192

Introduction

ICT-192 consists of Power, System, PMU, LCU board
ICT-192 has exchangeable Top board for different IC package
ICT-192 supports 8 pieces of Top board. Each Top board supports 2 Duts (ICT-192 supports maximally 16 Duts)
Provides 16 sets of VCC (5V/300mA)
Provides 16 sets of VPP (12V/80mA)
Provides 16 sets of PMU (each 8 I/O share 1 PMU)
Proovides 128 sets of I/O (upto 133 Mhz clock speed)

Specification (VPP/VCC)

VPP	Channel	16
	Mode	FV/MV/FI/MI/FN
	Voltage range	-1.5V ~ +12V
	Voltage resolution -- Force	0.343mV
	Voltage resolution -- Measure	0.381mV
	Current range	±5μA/±20μA/±200μA/±2mA/±80mA
	Current resolution -- Force	0.172nA/0.687nA/6.87nA/68.7nA/2.77μA
	Current resolution -- Measure	0.170nA/0.678nA/6.78nA/67.8nA/2.73μA
VCC	Channel	16
	Mode	FV/MV/FI/MI/FN
	Voltage range	-1.5V ~ +5V
	Voltage resolution -- Force	0.343mV
	Voltage resolution -- Measure	0.381mV
	Current range	±5μA/±20μA/±200μA/±2mA/±20mA/±298mA
	Current resolution -- Force	0.172nA/0.687nA/6.87nA/68.7nA/687nA/10.2μA
	Current resolution -- Measure	0.170nA/0.678nA/6.78nA/67.8nA/679nA/10.1μA

I/O Specification

Logic	Channel	128
	Voltage range	0 ~ 4V
	Voltage resolution	0.305mV
	Frequency	133Mhz
PMU	Channel	16
	Mode	FV/MV/FI/MI/FN
	Voltage range	-1.5V ~ +4V
	Voltage resolution -- Force	0.343mV
	Voltage resolution -- Measure	0.381mV
	Current range	±5μA/±20μA/±200μA/±2mA/±10mA
	Current resolution -- Force	0.172nA/0.687nA/6.87nA/68.7nA/343nA
	Current resolution -- Measure	0.170nA/0.678nA/6.78nA/67.8nA/339nA

SPI FT Function Test


SON8 ( 2*3 mm)	SOP16 (300 mils)

SPI DC & Function Test

Open test
Short test
Leakage test IIH/IIL
Standby / Active current
ID check
Write / Read status
Chip, Block, Sector erase
Program (pattern LSFR/CKBD...)
Verify / Blank check
HV test mode (Trim Voltage/Current)
1/4/8 I/O mode test

SPI NAND Test Condition

VCC 1.8V and 3.3V
ECC requirement setting
Detect CP bad block
Bad block condition setting
Bad block marking

Memory IC Tester

Memory IC Automated Testing Systems